Title:
LINEAR DISPLACEMENT MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JP3200469
Kind Code:
B2
Abstract:
PURPOSE: To easily manufacture to measure a distortion with effectively high precision by a method wherein fluctuations of electric-field patterns caused by interlock of an emitter are generated as an output signal.
CONSTITUTION: An elongated tab coupled to an H-shaped structure 40 is fitted on a measured sample ore together with a base plate at the free end, and interlocked in a linear direction to a plate 4, accordingly to a frame 44 by a distortion of the sample ore in a fitting position. Further, a vertical force spring plate 34 fitted on the fitting section 10 urges an emitter chip 38 provided in a center toward outward in a vertical direction rather close to the structure 40, so as to come into light contact with a detection plate 8. A conductive segment 208 of the chip 38 communicating linearly generates electric-field patterns which change in a linear direction. This is detected by sensor arrays 232, 236 of the plate 8 fixed to the plate 4, and an IC 228 provides a direction wave signal showing a change of electric-field patterns to a conductive seat 240. Thus, a distortion of the sample ore can be measured precisely.
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Inventors:
Stephen C. Jacobsen
Clark Sea. Davis
Mikylsey Mladejobski
Clark Sea. Davis
Mikylsey Mladejobski
Application Number:
JP16127492A
Publication Date:
August 20, 2001
Filing Date:
June 19, 1992
Export Citation:
Assignee:
University of Utah Research Foundation
International Classes:
G01B7/16; (IPC1-7): G01B7/16
Domestic Patent References:
| JP3502132A |
Attorney, Agent or Firm:
Akira Asamura (3 outside)