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Title:
LITHOGRAPHIC APPARATUS WITH AUTOFOCUS SYSTEM
Document Type and Number:
Japanese Patent JP2006179907
Kind Code:
A
Abstract:

To provide a lithographic apparatus with an autofocus system.

The lithographic apparatus comprises a lighting system which supplies a radiation beam, a pattern grant equipment which gives a pattern to the cross-section of the radiation beam and forms a patterned radiation beam, a substrate table configured to hold a substrate, and a projection system that includes a plurality of mirrors arranged to project the patterned radiation beam onto a target portion of the substrate. The lithographic apparatus further includes the autofocus system having (a) a light source, (b) a position sensitive detector, and (c) a light directing arrangement. The light directing arrangement directs a first portion of light from the light source to the projection system, and directs a second portion of light from the light source into the position sensitive detector. After the first portion of light has traveled through the projection system to the substrate and back through the projection system to the light directing arrangement, the first portion of light is directed to the position sensitive detector.


Inventors:
MICKAN UWE
VAN DIJSSELDONK ANTONIUS JOHAN
Application Number:
JP2005364266A
Publication Date:
July 06, 2006
Filing Date:
December 19, 2005
Export Citation:
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Assignee:
ASML NETHERLANDS BV
International Classes:
H01L21/027; G03F7/207
Domestic Patent References:
JPH09115822A1997-05-02
JP2002164276A2002-06-07
JPH09283423A1997-10-31
Attorney, Agent or Firm:
Hideto Asamura
Hajime Asamura
Katsunori Shirae
Yutaka Yoshida