PURPOSE: To eliminate the need for a program such as a relay controlling program and shorten the process of preparing a test sequence by a method wherein an input line selecting circuit and an output line selecting circuit are equipped with a function equivalent to the of an LSI evaluating tester.

CONSTITUTION: An input line selecting circuit 7, output line selecting circuit 8, test mode selecting circuit 5, and an input/output signal selecting line 9, which selects between input and output signals during normal or test operations, are incorporated into an LSI 1. Selection of a macro-cell 2 by the test mode selecting circuit 5 places the related input/output selecting circuit in an ENABLE status, causing an input pin 2 or output pin 3 to input or output signals. The input/output relationship is reversed between the pins 2 and 3 when a macro-cell 4 is selected, when the input pin 2 and output pin 3 serve as input/output (I/O) pins during a test. In this way, a readily available test pattern as shown in Figure B may be used without any modification. A sequence may be formulated with ease because the designation numbers are the same as those of the pins of the LSI 1.