Title:
MACHINING DEVICE FOR FLATTENING SAMPLE
Document Type and Number:
Japanese Patent JP3785002
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To prevent the erroneous detection of sample separation by providing a sample separation determining means applying wavelet conversion to data and judging and determining the sample separation with a wavelet spectrum when a sample is separated from a holder.
SOLUTION: The sample separation determining means 15 applies discrete wavelet conversion to the output wave-form of a sample separation sensor 11, extracts the feature of sample separation from a wavelet spectrum of the prescribed order (frequency component), and clearly distinguishes and determines a sample separation state from a noise component. When the determining means 15 determines the sample separation unaffected by the noise component, it outputs an action instruction to cope with the situation to a control means 16 of a turntable 1 or/and a holder 3. The control means 16 controls a holder lift mechanism 9 to lift the holder 3 from the turntable 1 together with a sample 4, thus preventing the breakage of the sample 4 and the turntable 1 or the like when the sample 4 is separated.
Inventors:
Kazuhiro Morita
Takashi Kugaya
Takashi Kugaya
Application Number:
JP25750599A
Publication Date:
June 14, 2006
Filing Date:
September 10, 1999
Export Citation:
Assignee:
株式会社日立製作所
株式会社日立サイエンスシステムズ
株式会社日立サイエンスシステムズ
International Classes:
B24B49/12; (IPC1-7): B24B49/12
Domestic Patent References:
| JP11010525A | ||||
| JP11148904A | ||||
| JP11010535A | ||||
| JP11039287A |
Foreign References:
| WO1998003305A1 |
Attorney, Agent or Firm:
Nitto International Patent Office
Katsuo Ogawa
Kyosuke Tanaka
Katsuo Ogawa
Kyosuke Tanaka
Previous Patent: SOLID COSMETIC
Next Patent: NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF
Next Patent: NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF