PURPOSE: To obtain a thin film magnetic head with less variance in the characteristic by measuring the change in a series resistance of a resistor array due to the removal of a short-circuit electrode attended with the processing of a base end face.
CONSTITUTION: Since all of resistor patterns R1WR10 of a resistor array are short-circuited by short-circuit electrodes 15, 16, the series resistance of the resistor arrays 11, 12 is almost zero. In applying working such as grinding to an end face 6 of a head base 5, the short-circuit electrodes 15, 16 are removed in the order from the side of the end face 6 and the series resistance of the resistor arrays 11, 12 is increased. When the processing is processed up to the position in broken lines 19 in figure,for example, the electrode short-circuiting the resistor patterns R1WR7 in the short-circuit electrodes 15, 16, resulting that the series resistance of the resistor arrays 11, 12 measured via measuring electrodes 17a, 17b and 18a, 18b is the addition of the resistance of the resistor patterns R1WR7 and the working dimension (depth d) is known from the resistance.
AKIYAMA JUNICHI
IWASAKI HITOSHI
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