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Title:
単結晶シリコン基板上の酸化亜鉛単結晶膜の製造方法及び製造装置並びに積層構造
Document Type and Number:
Japanese Patent JP4048316
Kind Code:
B2
Abstract:

To provide a method for producing a zinc oxide single crystal film which grows on a silicon substrate produced at a low cost and has excellent workability, and has high crystal integrity in the vertical direction to the substrate surface and in the crystal film and is electrically insulated from the silicon substrate.

A single crystal thin film 2 of calcium fluoride is epitaxially grown on a silicon single crystal substrate 1, and a zinc oxide single crystal film 3 is epitaxially grown on the single crystal thin film 2 of calcium fluoride. When the thickness of the single crystal thin film 2 of calcium fluoride is 15 nm or more, a high-quality zinc oxide single crystal film 3, which is oriented to a c axis in the vertical direction with respect to the surface of the substrate and is free from the rotation of a crystalline domain in the surface of the film, is obtained. When the thickness of the single crystal thin film 2 of calcium fluoride is 100 nm or more, the silicon single crystal substrate 1 and the zinc oxide single crystal film 3 are insulatingly separated.

COPYRIGHT: (C)2003,JPO


Inventors:
Yano Mitsuaki
Masataka Inoue
Nobuhiko Sasa
Koike one step
Application Number:
JP2001361242A
Publication Date:
February 20, 2008
Filing Date:
November 27, 2001
Export Citation:
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Assignee:
Japan Science and Technology Agency
International Classes:
C30B29/16; H01L41/316; H01L41/39
Domestic Patent References:
JP2000281495A
JP3276106A
JP2001114600A
JP8055919A
Attorney, Agent or Firm:
Kazuyuki Hirayama