Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MANUFACTURING METHOD OF SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2012019125
Kind Code:
A
Abstract:

To provide a simple manufacturing method of a semiconductor substrate including a single-crystal semiconductor film with less defects on an insulation surface, and provide a manufacturing method of a semiconductor device with high yield.

A manufacturing method of a semiconductor substrate comprises: forming an insulation layer on a surface of a single-crystal semiconductor substrate; forming an embrittled region by irradiating the single-crystal semiconductor substrate with ions via the insulation layer while etching the insulation layer; forming a junction layer on the surface of the single-crystal semiconductor substrate; attaching the single-crystal semiconductor substrate to a supporting substrate via the junction layer; forming a cleavage plane in the embrittled region by heat treatment; and separating a part of the single-crystal semiconductor substrate.


Inventors:
SUZUKI MIKI
YAMADE NAOTO
Application Number:
JP2010156554A
Publication Date:
January 26, 2012
Filing Date:
July 09, 2010
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SEMICONDUCTOR ENERGY LAB
International Classes:
H01L21/02; B23K15/00; H01L21/265; H01L21/336; H01L27/12; H01L29/786
Domestic Patent References:
JP2007533123A2007-11-15
JP2009004739A2009-01-08
JP2009111375A2009-05-21
Foreign References:
WO2001093334A12001-12-06