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Title:
MANUFSCTURE OF OHMIC ELECTRODE
Document Type and Number:
Japanese Patent JPS636837
Kind Code:
A
Abstract:

PURPOSE: To obtain an ohmic electrode having heat resistance of approx. 900°C by opening an insulating film and forming a high melting point metal silicide film by a bias sputtering method at least on the exposed silicon surface.

CONSTITUTION: With an SiO2 film 32 as a mask boron ions are implanted to an N-type Si substrate 31 to form a boron-implanted layer 33. After an SiO2 film 34 is formed, it is annealed to density the film 34, and implanted boron is simultaneously activated. A boron-doped p+ type layer surface 35 is exposed by a photoetching method to form a contact hole. After the surface 35 is etched, an Mo silicide film 36 is formed by a high frequency bias sputtering method. Thus, an ohmic electrode having heat resistance of approx. 900°C is obtained.


Inventors:
NAGASAWA EIJI
MOGAMI TORU
OKABAYASHI HIDEKAZU
Application Number:
JP14831186A
Publication Date:
January 12, 1988
Filing Date:
June 26, 1986
Export Citation:
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Assignee:
AGENCY IND SCIENCE TECHN
International Classes:
H01L21/28; H01L21/285; (IPC1-7): H01L21/28
Domestic Patent References:
JPS58194334A1983-11-12
JPS57120337A1982-07-27
JPS61111525A1986-05-29