PURPOSE: To obtain an ohmic electrode having heat resistance of approx. 900°C by opening an insulating film and forming a high melting point metal silicide film by a bias sputtering method at least on the exposed silicon surface.
CONSTITUTION: With an SiO2 film 32 as a mask boron ions are implanted to an N-type Si substrate 31 to form a boron-implanted layer 33. After an SiO2 film 34 is formed, it is annealed to density the film 34, and implanted boron is simultaneously activated. A boron-doped p+ type layer surface 35 is exposed by a photoetching method to form a contact hole. After the surface 35 is etched, an Mo silicide film 36 is formed by a high frequency bias sputtering method. Thus, an ohmic electrode having heat resistance of approx. 900°C is obtained.
MOGAMI TORU
OKABAYASHI HIDEKAZU
JPS58194334A | 1983-11-12 | |||
JPS57120337A | 1982-07-27 | |||
JPS61111525A | 1986-05-29 |