Title:
物質浸食監視システム及び方法
Document Type and Number:
Japanese Patent JP7026125
Kind Code:
B2
Abstract:
Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
Inventors:
Alexander sea rouge
Yakup Byram
Yakup Byram
Application Number:
JP2019545877A
Publication Date:
February 25, 2022
Filing Date:
April 25, 2017
Export Citation:
Assignee:
PaneraTech, Inc.
International Classes:
G01B15/00; G01N22/00
Domestic Patent References:
| JP2006153845A | ||||
| JP2017511490A |
Foreign References:
| US20150276577 |
Attorney, Agent or Firm:
Takuji Yamada
Hiroshi Okabe
Kazuhisa Inaba
Hiroshi Okabe
Kazuhisa Inaba