Title:
MEASURING SYSTEM, MEASURING DEVICE, MEASURING METHOD, AND MEASURING PROGRAM
Document Type and Number:
Japanese Patent JP2022077725
Kind Code:
A
Abstract:
To provide a measuring system and the like capable of shortening time required to measure 3D data of an object.SOLUTION: A measuring system comprises: a 3D sensor that is mounted on a robot, and measures 3D data indicating the three-dimensional coordinates of each point on the surface of an object; a displacement detection device that detects displacement of each joint of the robot; a drive device that drives each joint of the robot; a sensor control unit that controls the 3D sensor to measure the 3D data of the object at one or a plurality of measuring points; a synthesis unit that performs 3D synthesis of the 3D data of the object measured before a first operation is performed on the object by the robot, and the 3D data of the object measured at the one or plurality of measurement points after the first operation has been performed on the object by the robot; and a robot control unit that outputs, to the drive device, a drive command to control a second operation by the robot, on the basis of the three-dimensional coordinates of each point on the surface of the object indicated by the 3D data obtained by the 3D synthesis.SELECTED DRAWING: Figure 6
Inventors:
FU XINGDOU
Application Number:
JP2020188701A
Publication Date:
May 24, 2022
Filing Date:
November 12, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
G01B11/00; B25J13/08
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Kentaro Ito
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito
Kentaro Ito