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Patent Searching and Data


Title:
MEASURING APPARATUS FOR SEMICONDUCTOR POWER AMPLIFIER
Document Type and Number:
Japanese Patent JPS5790175
Kind Code:
A
Abstract:

PURPOSE: To enable a accurate measurement of a breakdown withstand voltage during the short-circuiting of a load by detecting the maximum current of an output current while the output current flows in a short time with a power amplifying IC used for audio equipment or the like under a load short-circuiting.

CONSTITUTION: The output terminal 8 of a power amplifying IC2 is short-circuited with an output coupling capacitor 5 and a normal load, for example, a resistance 6 ranging from 0.1 to several Ω and a pulse generator 1 is connected to the input terminal 7 into which a single pulse 9 with a pulse width of less than 50ms, for example, is input. When a single pulse signal 9 is supplied to an IC2 from the pulse generator 1, current 11 from the IC2 is converted to a voltage drop 10 with a resistance 6 and the maximum voltage thereof is detected with a peak hold circuit 3 and measured with a voltage discriminator 4. As the resistance value of the resistance 6 is previously known, the measurement of the voltage enables the discrimination of the current during the short-circuiting of a load.


Inventors:
YOKOYAMA RIYOUICHI
Application Number:
JP16629880A
Publication Date:
June 04, 1982
Filing Date:
November 26, 1980
Export Citation:
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Assignee:
NIPPON ELECTRIC CO
International Classes:
G01R31/28; G01R31/00; (IPC1-7): G01R31/28