Title:
METHOD AND APPARATUS FOR ALIGNING COMPONENT FOR INSPECTION
Document Type and Number:
Japanese Patent JP2004132986
Kind Code:
A
Abstract:
To provide a method for aligning a component including at least a first and a second datum points for inspection.
The method includes providing a tool 50 including a fixture having at least a first and a second datum point locator 84 and 86, aligning the first datum point with the first datum point locator, and rotating the component about the first datum point to align the second datum point with the second datum point locator, measuring a third datum point included by the component 10 by using a linear variable differential transformer 64.
Inventors:
JONES DANIEL EDWARD
JUNEAU JACQUES
JUNEAU JACQUES
Application Number:
JP2003348926A
Publication Date:
April 30, 2004
Filing Date:
October 08, 2003
Export Citation:
Assignee:
GEN ELECTRIC
International Classes:
B23Q3/18; G01B21/00; G01B5/00; G01B5/20; (IPC1-7): G01B21/00
Domestic Patent References:
| JPH11160036A | 1999-06-18 | |||
| JPS57139605A | 1982-08-28 | |||
| JP2000176766A | 2000-06-27 |
Attorney, Agent or Firm:
Kenichi Matsumoto
Hirokazu Ogura
Nobukazu Ito
Hirokazu Ogura
Nobukazu Ito