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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING SURFACE SHAPE OF SKIN
Document Type and Number:
Japanese Patent JP2003344027
Kind Code:
A
Abstract:

To easily and rapidly carry out processes from acquisition to measuring of a reflection type replica.

When a reflection type replica is arranged at 30° relative to the center axis of light which diverges at 20° uniformly, the density and the length of a shadow corresponding to the shape of a wrinkle are varied because of a scattering characteristic of the light when photographing the reflection type replica. Therefore, a surface shape of a skin can be accurately measured by utilizing the characteristic. In the method for acquiring a reflection type replica, a sampling tape having a sampling region is affixed to the surface of the skin, and replica liquid is coated thereon. Furthermore, a cover tape is affixed thereon, and the sampling tape and upper members are peeled together after hardening the replica, thereby preventing deformation of the replica. In addition, the shape of the sampling tape is made up so that it is affixed in a direction in which the wrinkle extends, thereby photographing the reflection type replica and measuring the surface shape of the skin easily and rapidly after acquiring the reflection type replica.


Inventors:
MINORIKAWA NAOYUKI
Application Number:
JP2002153683A
Publication Date:
December 03, 2003
Filing Date:
May 28, 2002
Export Citation:
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Assignee:
MINORIKAWA NAOYUKI
International Classes:
G01B11/24; A61B5/107; (IPC1-7): G01B11/24; A61B5/107