Title:
METHOD, DEVICE, AND MICROSCOPY FOR THREE-DIMENSIONAL IMAGING IN MICROSCOPY USING ASYMMETRIC PSF
Document Type and Number:
Japanese Patent JP2023109177
Kind Code:
A
Abstract:
To provide a method for three-dimensional imaging in microscopy.SOLUTION: Aberrations of detection radiation from a specimen 5 are corrected in a detection beam path by a correction element, and the corrected detection radiation is captured in a spatially resolved form. A method is distinguished by the fact that: a best-possible correction setting of the correction element, with which aberrations occurring at the time are reduced as much as possible, is determined; and on the basis of the best-possible correction setting, a flawed correction setting, which is a setting in which aberrations occurring lead to an asymmetric point spread function PSFasymm of the detection radiation, is determined. The asymmetric point spread function occurring with the flawed correction setting is determined, the determined flawed correction setting is brought, image data of the specimen 5 is captured two-dimensionally, and on the basis of the respective captured manifestation of asymmetry of the asymmetric point spread function, a Zc position in a direction of an optical axis A2 of the detection beam path is in each case allocated at least to selected image data.SELECTED DRAWING: Figure 5
Inventors:
THOMAS KALKBRENNER
JOERG SIEBENMORGEN
JOERG SIEBENMORGEN
Application Number:
JP2023009737A
Publication Date:
August 07, 2023
Filing Date:
January 25, 2023
Export Citation:
Assignee:
ZEISS CARL MICROSCOPY GMBH
International Classes:
G02B21/06; G01N21/64
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Osamu Miyazaki
Tadahiko Ito
Osamu Miyazaki
Previous Patent: Aircraft lift system
Next Patent: Equipment for producing beverages, in particular coffee
Next Patent: Equipment for producing beverages, in particular coffee