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Title:
METHOD AND DEVICE FOR EVALUATING RESIDUAL STRESS OF ACTUAL STRUCTURE
Document Type and Number:
Japanese Patent JPH05346377
Kind Code:
A
Abstract:

PURPOSE: To make easy and quick evaluation of a residual stress of an actual structure possible by putting and fixing a pyramid-shaped connector on a strain gage stuck on the place at which an X-ray residual stress of the actual structure is determined and by detecting an output of the strain gage.

CONSTITUTION: Four strain Wheatstone gage bridge or a strain gage 1 constituting a part of the bridge, for instance, is stuck on the place at which a residual stress of a member constituting an actual structure 13 is determined by a small-sized X-ray diffraction apparatus, and a pyramid-shaped connector is put and fixed on the gage so as to cover it. A contact probe is pressed on the connector 2, an output of the gage 1 is detected by an evaluating device integrated with the contact probe, a stress determined on the basis of the output is corrected by a measured value of the X-ray residual stress and then a change in the residual stress of the structure 13 is evaluated. The gage 1 can be used for a long period, since it is isolated from the outdoor air. Besides, the position of the connector 2 can be recognized easily, since the height thereof is larger than the thickness of paint 14 on the surface of the structure 13 and the connector projects above the surface of the structure 13 even after the paint 14 is applied.


Inventors:
OKAMOTO MASAYUKI
HANAMURA TOSHIHIRO
KIKUCHI TOSHIJI
Application Number:
JP15502092A
Publication Date:
December 27, 1993
Filing Date:
June 15, 1992
Export Citation:
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Assignee:
NIPPON STEEL CORP
International Classes:
G01M99/00; (IPC1-7): G01M19/00
Attorney, Agent or Firm:
Tomoyuki Yathata (1 outside)