Title:
METHOD AND EQUIPMENT FOR INSPECTING LIGHT EMITTING ELEMENT ARRAY
Document Type and Number:
Japanese Patent JP2007090814
Kind Code:
A
Abstract:
To provide a method and equipment for inspecting a light emitting element array with high precision in a short time.
The equipment 40 for inspecting a light emitting element array 25 comprises a line sensor camera 48 for imaging a light emitting element array 25 having an organic EL element, and a moving table 42 and a conveyance mechanism 43 for arranging the organic EL element in the imaging range of the line sensor camera 48 by conveying the light emitting element array 25. An inspection terminal provided in the inspection equipment 40 is equipped with an image processor for processing digital image data obtained by imaging the organic EL element and judging whether light emitting state of the organic EL element is acceptable or not.
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Inventors:
GYODA KOZO
Application Number:
JP2005286407A
Publication Date:
April 12, 2007
Filing Date:
September 30, 2005
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
B41J2/44; B41J2/45; B41J2/455; G03G21/00
Attorney, Agent or Firm:
Masahiko Ueyanagi
Fujitsuna Hideyoshi
Osamu Suzawa
Fujitsuna Hideyoshi
Osamu Suzawa
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