Title:
METHOD FOR EVALUATING QUALITY OF CRYSTALLOID AND APPARATUS THEREFOR
Document Type and Number:
Japanese Patent JP3674801
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To judge the crystal mode, size and flaw kind of a crystalloid of diamond or the like by image processing.
SOLUTION: The image of the crystalloid C placed on a substrate 7 is taken by a camera 1 to obtain the contour image of the crystalloid C and the image of the crystal surface having a perpendicular substantially parallel to the optical axis of the camera 1 and the placing direction of the crystalloid is specified on the basis of both of the contour image and the crystal surface image to measure a crystal mode. The crystal mode is calculated on the basis of the placing direction of the crystalloid and the predetermined characteristic quantity of the crystalloid. As the feature quantity, a ratio of the area of the contour image and that of the crystal surface image or a ratio of the circumferential length of the contour image and that of the crystal surface image may be mentioned.
Inventors:
Yoshihiro Oka
Shigeru Kato
Saji Western
Shigeru Kato
Saji Western
Application Number:
JP27749996A
Publication Date:
July 27, 2005
Filing Date:
September 27, 1996
Export Citation:
Assignee:
Sumitomo Electric Industries, Ltd.
International Classes:
G01B11/02; G01B11/26; G01B11/28; G01M11/00; G01N21/87; G02B27/00; G06T1/00; G06T7/00; (IPC1-7): G01N21/87; G01B11/02; G01B11/26; G01B11/28; G02B27/00; G06T1/00
Domestic Patent References:
| JP7004934A | ||||
| JP8327556A | ||||
| JP7055709A |
Attorney, Agent or Firm:
Hidemi Aoki
Hiroshi Yamano
Hiroshi Yamano