Title:
METHOD OF INSPECTING DEVIATION OF INTERNAL ELECTRODES IN PRODUCTION OF LAMINATED CAPACITOR
Document Type and Number:
Japanese Patent JP3490206
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To efficiently inspect the relative deviations of inner electrodes of a laminated capacitor with respect to their lengths and widths and reduce the production ratio of defectives.
SOLUTION: A laminate of ceramic green sheets having many inner electrodes is cut along a line inside its marginal lamination extra part into chips. Each inner electrode of the green sheet has extensions A1', A3' in length direction and those A1", A3" in the width direction which are exposed at the cut faces D1', D1" of the extra parts. On a picture taken from these cut faces, the relative dimensional deviations of the extensions in the length and width directions are measured.
Inventors:
Tadashi Inoue
Application Number:
JP2914496A
Publication Date:
January 26, 2004
Filing Date:
February 16, 1996
Export Citation:
Assignee:
ROHM Co., Ltd.
International Classes:
H01G4/12; H01G4/30; H01G13/00; (IPC1-7): H01G13/00; H01G4/12; H01G4/30
Domestic Patent References:
| JP3246917A | ||||
| JP6132180A |
Attorney, Agent or Firm:
Akio Ishii (2 outside)
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