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Patent Searching and Data


Title:
METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY ELEMENT WITH THIN-FILM TRANSISTOR
Document Type and Number:
Japanese Patent JPH0792490
Kind Code:
A
Abstract:

PURPOSE: To inspect liquid crystal characteristics and spot defects before packaging of a driving circuit by separately wiring common electrode lines and additive capacitance lines and applying a specific voltage to the common electrode lines and the additive capacitance lines.

CONSTITUTION: The common electrode lines 9 and additive capacitance lines 10 of the liquid crystal display element with thin-film transistors(TFTs) in the course of a production line are formed as the separate wirings which are not electrically connected. Further, the additive capacitance lines 10 for each of respective pixels are shorted and the source wirings and gate wirings for each of the respective lines are respectively short circuited. While the TFTs 6 are held off, the voltage shifted in phase by 180° is applied to the common electrode lines 9 and the additive capacitance lines 10. Then, the voltage based on the capacity ratio of a liquid crystal capacitance CLC and an additive capacitance CS is eventually directly applied on the liquid crystal layer 4. The common voltage is eventually applied to all the pixels according to such driving method and, therefore, a raster display is obtd.


Inventors:
SATO MAKOTO
HAYATA NORIFUMI
Application Number:
JP23511293A
Publication Date:
April 07, 1995
Filing Date:
September 21, 1993
Export Citation:
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Assignee:
NIPPON DENSO CO
International Classes:
G02F1/13; G02F1/136; G02F1/1368; G09F9/35; (IPC1-7): G02F1/136; G02F1/13; G09F9/35
Attorney, Agent or Firm:
Kentaro Iida