Title:
METHOD FOR INSPECTING OPTICAL FILM
Document Type and Number:
Japanese Patent JP2013148448
Kind Code:
A
Abstract:
To provide an inspection method which can accurately detect a defect, such as a foreign material on an optical film and a defect due to a small change in film thickness around the foreign matter, can handle an inspected optical film as a product and is performed by efficient visual observation.
An inspection method determines the existence/absence of abnormality of reflected light by irradiating a light source with light from one surface side of an optical film having a transparent optical function layer on the one surface of the film while the other surface of the optical film is brought into close contact with a metal stage member through a transparent liquid layer.
Inventors:
SUZUKI NOBUYASU
Application Number:
JP2012008771A
Publication Date:
August 01, 2013
Filing Date:
January 19, 2012
Export Citation:
Assignee:
TOPPAN PRINTING CO LTD
International Classes:
G01N21/88
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