Title:
METHOD AND INSTRUMENT FOR MEASURING DIELECTRIC CONSTANT OF DIELECTRIC PLATE
Document Type and Number:
Japanese Patent JP3289398
Kind Code:
B2
Abstract:
PURPOSE: To enable highly accurate measurements by varying the dimension of the opening of a holding portion so as to adjust the coupled state of the coupled part of dielectric resonators.
CONSTITUTION: A dielectric plate 18 which is a sample to be measured is mounted on a holding late 19a and the opening (d) of holding plates 19a, 19b is varied to achieve the required amount of reception of frequency, and then resonance frequency is measured to calculate a dielectric constant. Since the coupled state of the coupled part of dielectric resonators 3a, 3b in TE01δ mode resonance can be adjusted by varying the opening (d) of the holding plates 19a, 19b, the amount by which the resonance frequency of the dielectric resonators 3a, 3b is received can be set to an optimum value. The thickness of each holding plate 19a, 19b is properly determined so that the dielectric plate 18 is located at a stationary point halfway between the dielectric resonators 3a, 3b.
Inventors:
Shigeyuki Mikami
Hirotsugu Abe
Yukio Higuchi
Hirotsugu Abe
Yukio Higuchi
Application Number:
JP11722093A
Publication Date:
June 04, 2002
Filing Date:
May 19, 1993
Export Citation:
Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
G01R27/26; (IPC1-7): G01R27/26
Domestic Patent References:
| JP5296072A | ||||
| JP61182582A |
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