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Patent Searching and Data


Title:
METHOD AND SYSTEM FOR ETCHING
Document Type and Number:
Japanese Patent JP2004146700
Kind Code:
A
Abstract:

To improve stability and reliability when forming asperity on the surface of a substrate used for a solar cell, and so on.

In an etching method, the surface of a substrate carried in an etching chamber is roughened by performing dry etching by introducing an etching gas in a state where the surface of the substrate is covered with a plate member through which many openings are formed and the inside of the etching chamber is evacuated. Before the inside of the etching chamber is evacuated, the plate member is cleaned.


Inventors:
INOMATA YOSUKE
Application Number:
JP2002311821A
Publication Date:
May 20, 2004
Filing Date:
October 25, 2002
Export Citation:
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Assignee:
KYOCERA CORP
International Classes:
H01L21/3065; H01L31/04; (IPC1-7): H01L21/3065; H01L31/04