To provide a method of evaluating each component of a subject device to be tested highly precisely.
The method of testing characteristics of the device is composed of: a step in which a testing signal intermingled with a plurality of sine waves of different frequencies output from a signal generater 1d is inputted into the subject device to be tested; a step 602 in which a signal output by the subject device 8d corresponding to the testing signal intermingled with the plurality of sine waves of different frequencies are stored in a memory 4d; a step in which the components are derived indicating the characteristics of the subject device 8d by analyzing the signal stored in the memory 4d, a step 606 in which a least mean norm function obtained by applying the least mean norm to the difference between the signal stored in the memory 4d and the testing signal are partially differentiated regarding to the components so as to minimize the functions, and the values of the components are analyzed by a processor 5d, so that each function partially differentiated regarding to the components become zero or ≤desired threshold .
KOBAYASHI HARUO
| JP2004522167A | 2004-07-22 |
Arihara Koichi
Matsushima Tetsuo
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