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Patent Searching and Data


Title:
METHOD FOR TRACING DEFECT INFORMATION ON PAPERMAKING LINE
Document Type and Number:
Japanese Patent JPH04174788
Kind Code:
A
Abstract:

PURPOSE: To enhance efficiency of line operation, simultaneously grasp conditions of defects occurred, facilitate claim treatment of products and trace defect information on the line by providing a defect sensor in the papermaking line and simultaneously introducing a computer.

CONSTITUTION: A defect sensor 3 for sensing defects of machine-glazed paper and sheet paper produced in a continuous process of a papermaking line is provided and a computer 1 for controlling the aforementioned whole line is simultaneously installed to trace defect information on the above-mentioned machine-glazed paper and sheet paper. The operation of the line is controlled based on the aforementioned defect information. Thereby, defect information on the papermaking line is traced.


Inventors:
WATANABE IWAO
Application Number:
JP29708390A
Publication Date:
June 22, 1992
Filing Date:
November 05, 1990
Export Citation:
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Assignee:
TOSHIBA CORP
International Classes:
D21F7/04; (IPC1-7): D21F7/04
Attorney, Agent or Firm:
Shoko Inomata (1 person outside)