Title:
MICROSCOPE SYSTEM
Document Type and Number:
Japanese Patent JP2001356278
Kind Code:
A
Abstract:
To enable observation and measurement of high resolution to be executed by a microscope system which executes observation and measurement by an electronic image pickup element.
The microscope system has observation means composed of an objective lens and the electronic image pickup element and magnifying factor Mob of the objective lens satisfies a condition described below. (1) 300≤Mob≤500.
Inventors:
ADACHI SADASHI
Application Number:
JP2000176587A
Publication Date:
December 26, 2001
Filing Date:
June 13, 2000
Export Citation:
Assignee:
OLYMPUS OPTICAL CO
International Classes:
G02B21/36; G02B21/02; (IPC1-7): G02B21/36; G02B21/02
Attorney, Agent or Firm:
Koji Mukai
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