PURPOSE: To facilitate electrical connection work between a semiconductor integrated circuit under test and a tester.

CONSTITUTION: A semiconductor integrated circuit 8 under test is set with the electrodes 9 directing upward. A cap 12 is applied to the integrated circuit 8 and the position of the electrodes 9 is confirmed through the cap 12 before the contacts 4 on the cap 12 are superposed on the electrodes 9. Since the position of the electrode 9 can be confirmed, accuracy is enhanced in the alignment of the electrodes 9 and the contacts 4.