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Patent Searching and Data


Title:
EVALUATION METHOD AND MEASUREMENT METHOD OF SIMULATION
Document Type and Number:
Japanese Patent JPH0750332
Kind Code:
A
Abstract:

PURPOSE: To precisely evaluated the accuracy of simulation by a measured value by calculating a third physical amount estimated based on a theory from a second physical amount of lattice point falling within a set range and by comparing a measured first physical amount with the third physical amount calculated by simulation.

CONSTITUTION: After optical beam diameter and strength of incident light 2 are set and a probe region 5 is decided, probe inspection is executed for getting a measured value thereof. Meanwhile, at the simulator side, the simulator is started and simulation result for each lattice point is obtained. Furthermore, a lattice point included in the probe region 5 of an inspection device is selected, weighting is carried out based on a positions, etc., of the selected lattice point in the probe region 5 and inspection result predicted when Raman spectroscopic inspection is executed is calculated. Thereby, the simulation can be evaluated exactly by checking stress simulation result against a measured value of a stress measurement device.


Inventors:
ISHIKAWA KATSUHIKO
Application Number:
JP19327093A
Publication Date:
February 21, 1995
Filing Date:
August 04, 1993
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01L1/00; G01L1/24; H01L21/66; (IPC1-7): H01L21/66; G01L1/00; G01L1/24
Attorney, Agent or Firm:
Yamato Tsutsui