Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
NEAR FIELD POLARIZATION MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JP2006300708
Kind Code:
A
Abstract:

To provide a near field rotatory polarization measuring instrument having a spatial resolution of light diffraction limit or more.

This near field rotatory polarization measuring instrument 10 is provided with: a near field probe 14 having in its tip an opening smaller than a wavelength of light used in measurement, and for emitting a near field light of linear polarization from the opening to irradiate a sample with the near field light; a detecting means 22 for detecting the light transmitted through the sample; an analyzer 18 provided in a preceding stage of the detecting means; and an analyzer rotating means 20 for rotating the analyzer around an optical axis as the center, and for changing an angle of a transmission axis thereof, and measures an angle of rotation of the sample by rotating the analyzer with the analyzer rotating means.


Inventors:
INOUE TSUTOMU
SATO FUMINORI
NARITA TAKAHITO
SENUMA MUTSUMI
Application Number:
JP2005122311A
Publication Date:
November 02, 2006
Filing Date:
April 20, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
JASCO CORP
International Classes:
G01B11/00; G01N21/21; G01Q60/18; G01Q60/22
Domestic Patent References:
JPH10325840A1998-12-08
JPH1164214A1999-03-05
JP2000304521A2000-11-02
JP2002162333A2002-06-07
Attorney, Agent or Firm:
Yuji Iwahashi