Title:
NEAR MAGNETIC FIELD PROBE, NEAR MAGNETIC FIELD PROBE UNIT, NEAR MAGNETIC FIELD PROBE ARRAY, AND MAGNETIC FIELD MEASURING SYSTEM
Document Type and Number:
Japanese Patent JP3583276
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To reduce measuring errors by preventing, using simple constitution, the interlinkage of a magnetic field from a measured part to the extension wire part of a near magnetic field probe which is brought close to the subject of measurement to detect a magnetic field.
SOLUTION: In a near magnetic field probe 1, which has on a substrate 2a coil 3 comprising one turn of winding made of a conductive thin film or a plurality of turns of windings with insulating layers between them, an extension wire 4 from the coil 3, and a pad 5 to which the extension wire 4 is connected, the extension wire 4 is provided with a conductive thin film 7 for use as a shield, with an insulating layer 6 between them. Thus, by providing the shield layer made of the conductive thin film 7 on the extension wire 4, errors caused by the interlinkage of magnetic flux to the extension wire are reduced to enable measurements of higher accuracy.
Inventors:
Takatayoshi
Yoshiyuki Kiyosawa
Yoshiyuki Kiyosawa
Application Number:
JP35779397A
Publication Date:
November 04, 2004
Filing Date:
December 25, 1997
Export Citation:
Assignee:
株式会社リコー
International Classes:
G01R33/02; G01R29/08; G01R33/10; (IPC1-7): G01R29/08; G01R33/02; G01R33/10
Domestic Patent References:
| JP8248080A | ||||
| JP7225251A | ||||
| JP8240624A |
Attorney, Agent or Firm:
Shogo Honda
Toru Kabayama
Toru Kabayama
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