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Title:
NONDISPERSION-TYPE INFRARED GAS ANALYSIS SYSTEM AND DEVICE THEREFOR
Document Type and Number:
Japanese Patent JPH03107744
Kind Code:
A
Abstract:

PURPOSE: To analyze a gas rapidly and accurately with a compact device by dettaching a plurality of long and narrow fasteners, being extended around a sample room from a source module to a light reception module.

CONSTITUTION: The application of infrared rays from a source 48 is reflected by a spherical mirror 50 through a window 52 for closing an opening in a housing 46. Then, radiation rays through a window 64 are focused by a silicon plano-convex lens 66, pass through a radiation ray chopper assembly 68, and are directed toward radiation rays 70 consisting of lead selenide forward and backward. Then, by removing a plurality of long and narrow fasteners extended around a sample room 42 from a source module 40 to a light reception module 44, the contaminants on the optical surfaces of the windows 52 and 64 can be easily washed, thus separating the source 48 and the module 44 easily from the sample room 42 and exposing the contaminated optical surface. They are washed by wiping off the inside of the sample room 42 that can be accessed easily and wiping off the windows 52 and 64.


Inventors:
EDOWAADO ERU CHIYUARII
KIISU KAASUTE
ROSU II JIYONSON
DEIBUITSUDO OO DANIERUSON
Application Number:
JP13517990A
Publication Date:
May 08, 1991
Filing Date:
May 24, 1990
Export Citation:
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Assignee:
SENSOR ZU INC
International Classes:
G01N21/27; G01N21/35; G01N21/31; (IPC1-7): G01N21/35
Attorney, Agent or Firm:
Yu Saito (2 outside)



 
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