光干渉断層計 - NIDEK CORPORATION

Title:

光干渉断層計

Document Type and Number:

Japanese Patent JP6880550

Kind Code:

B2

Abstract:

PROBLEM TO BE SOLVED: To acquire information on a dynamic state of an eye to be examined satisfactorily.SOLUTION: An interference optical system 1 irradiates a measurement light from a light source 102 onto a tissue of an eye E to be examined, and detects the interference between a reference light and the measurement light reflected by the tissue by a detector 120. A control part 70 acquires A scan data based on a signal output from the detector 120 with a cycle of at least 300 kHz or more, and generates three-dimensional OCT data on the basis of the acquired A scan data as needed. The control part 70 then performs analysis processing for each of the three-dimensional OCT data generated as needed, and outputs real time analysis results for the three-dimensional OCT data generated as needed.SELECTED DRAWING: Figure 1

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Inventors:

Naomi Isogai
Hideki Aono
Yukihiro Higuchi
Yuji Murase

Application Number:

JP2016019365A

Publication Date:

June 02, 2021

Filing Date:

February 03, 2016

Export Citation:

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