Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
PHOTO MASK
Document Type and Number:
Japanese Patent JPS5517133
Kind Code:
A
Abstract:

PURPOSE: To prevent the diffusion of impurities, particularly Na elements, etc. from glass substrates by providing a thin film composed of heavy metal oxides between the glass substrate and metal film.

CONSTITUTION: Metal, e.g., Cr, is used for target and a Cr2O3 film 2 is provided as an impurity barrier to thicknesses of about 50 to 100 on a glass substrate 1 by reaction sputtering in an atmosphere comprising mixing O2 in inert gas. Next, the supply of O2 is interrupted, and a metal Cr film 4 is formed to a thickness of about 500 by ordinary sputtering and further O2 is introduced again and a Cr2O3 film 4 is formed a thickness of about 300 by reaction sputtering. Thereby, etching at the patterning is evenly progressed and the desired accurate mask patterns are obtainable.


Inventors:
NAKAGAWA KENJI
Application Number:
JP8935978A
Publication Date:
February 06, 1980
Filing Date:
July 24, 1978
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJITSU LTD
International Classes:
G03F1/00; G03F1/46; H01L21/00; H01L21/027; (IPC1-7): G03F1/02; H01L21/00
Domestic Patent References:
JPS5322031A1978-03-01
JPS51113466A1976-10-06