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Patent Searching and Data


Title:
PICTURE ANALYZER AND ELLIPSE ANALYSIS METHOD
Document Type and Number:
Japanese Patent JPH07311847
Kind Code:
A
Abstract:

PURPOSE: To quickly obtain the feature quantity of an ellipse from coordinates of points of contact by applying an area extraction frame to a picture to be analyzed to obtain the points of contact and adopting a calculation formula.

CONSTITUTION: A picture search means 11 and a data operation means 12 are provided. The means 11 sets an area extraction frame 14A to a picture 14 to be analyzed, which is converted into numerical data, to search coordinates x, y of points of contact where the area extraction frame 14A and the picture 14 to be analyzed are brought into contact with each other. The means 12 calculates coordinates xo, yo or the center or the picture 14 to be analyzed based on searched coordinates x, y of points of contact and calculates feature quantities (a), (b), and of the picture 14 to be analyzed based on coordinates xo, yo of the center and coordinates x, y of points of contact.


Inventors:
HIRAHARA TAKAO
NAKAMURA YUTAKA
HIZUKA TETSUO
Application Number:
JP10401394A
Publication Date:
November 28, 1995
Filing Date:
May 18, 1994
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G06T7/60; G06T7/00; (IPC1-7): G06T7/00; G06T7/60
Attorney, Agent or Firm:
Keizo Okamoto