平面表示装置のシミュレーション方法、シミュレーション装置、検査方法、および検査装置

Japanese Patent JP4160173

B2

PROBLEM TO BE SOLVED: To provide methods and devices for simulating and inspecting capable of developping, designing and manufacturing a flat-display device efficiently and at low costs. SOLUTION: By assuming a pseudo point defect according to various parameters based on the design of a liquid crystal display device 10, and displaying it by providing this pseudo-corrected pixel part at the time of correcting this point defect with a repair circuit with a step difference to other normal pixel parts, a state of the display of the liquid crystal display device 10 is simulated after correction of the point-like defect. In the product inspection, comparison check is carried out by driving an actually manufactured liquid crystal display device 10 where the point-like defect is corrected, and displaying the actually corrected pixel part and the pseudo-corrected pixel part by the simulation on the screen of the liquid crystal display device 10 at the same time.

Noboru Kashimoto
Katsuhiko Inada

JP28427698A

October 01, 2008

October 06, 1998

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Toshiba Matsushita Display Technology Co., Ltd.
Toshiba Electronic Engineering Co., Ltd.

G02F1/13; G01R31/00; G06G7/48

JP3209422A
JP4016930A
JP6308532A
JP9054341A
JP10232377A

Takehiko Suzue
Satoshi Kono
Makoto Nakamura
Kurata Masatoshi
Takashi Mine
Yoshihiro Fukuhara
Sadao Muramatsu
Ryo Hashimoto
Sadao Muramatsu
Ryo Hashimoto
Satoshi Kono
Makoto Nakamura
Shoji Kawai

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