Title:
POLARIZATION MEASURING DEVICE
Document Type and Number:
Japanese Patent JP2005292020
Kind Code:
A
Abstract:
To enable measurement of Stokes parameters and a DOP at a low cost in a short time.
The polarization measuring device 10a varies a refractive index of LiNbO3, by control of voltages applied to electrodes 9a-9c or electrodes 22a-22d, and then varies an optical polarization state of light propagating in an optical waveguide 5. By the control of the voltages applied to electrodes 9a-9c, the optical polarization state of the light propagating in the optical waveguide 5 or in an optical crystal 21 and parameters representing characteristics of a wave length board when varying the polarization state by using the wave length board, can be set arbitrarily and easily.
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Inventors:
IN DAIRETSU
MATSUURA HIROSHI
MIZUNO KAZUYASU
MATSUURA HIROSHI
MIZUNO KAZUYASU
Application Number:
JP2004109676A
Publication Date:
October 20, 2005
Filing Date:
April 02, 2004
Export Citation:
Assignee:
FURUKAWA ELECTRIC CO LTD
International Classes:
G01J4/04; G02B5/30; G02B27/28; G02F1/035; (IPC1-7): G01J4/04; G02B5/30; G02B27/28; G02F1/035
Attorney, Agent or Firm:
Takaho Kawawa