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Title:
POSITIVE TYPE RESIST C0MPOSITION
Document Type and Number:
Japanese Patent JPH0829977
Kind Code:
A
Abstract:

PURPOSE: To provide the positive type photosensitive composition, which can prevent the generation of halation without hindering sensitivity, resolution and residual film ratio.

CONSTITUTION: This positive type resist composition contains alkali soluble phenol resin (a), 1,2-naphthoquinonediazide sulfonic acid ester (b) of the compound having dibendzylideneaceton framework. In the formula, R1-R10 mean hydrogen atom, halogen atom, hydroxyl group, alkyl group, aryl group, alkenyl group, alkinyl group, amino group, nitro group, cyano group, alkoxy group, acetyl group, 1, 2-naphthoquinonediazide-5-sulfonyl group, and they can be the same one or they can be different from each other, and at least of them means hydroxyl group. R11-R12 mean hydrogen atom, alkyl group and aryl group, and they can be the same one or they can be different from each other.


Inventors:
HAYASHI HIROSHI
HAYASHI ATSUSHI
KAWADA MASAJI
Application Number:
JP18783094A
Publication Date:
February 02, 1996
Filing Date:
July 18, 1994
Export Citation:
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Assignee:
NIPPON ZEON CO
International Classes:
G03F7/004; G03F7/022; H01L21/027; (IPC1-7): G03F7/022; G03F7/004; H01L21/027