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Patent Searching and Data


Title:
PROBE FOR SCANNING ELECTRON MICROSCOPE
Document Type and Number:
Japanese Patent JPH06109415
Kind Code:
A
Abstract:

PURPOSE: To form a metal probe wherein the radius of curvature of its tip is sufficiently small and its surface is hard to oxidize by a method wherein the probe is constituted of a metallic main body and of an oxidation-preventing layer with which the main body is covered.

CONSTITUTION: For example, linear tungsten having a diameter of about 0.5mm is worked to be a probe shape by a mechanical polishing method so as to have a polished angle of about 20°, and a probe main body is formed. The main body is degreased and cleaned by Freon, triethylene or the like, it is immersed in a gold plating liquid at a liquid temperature of about 100°C for about 30 minutes, and a gold thin film is formed on the surface by an electroless plating method. Thereby, it is possible to obtain a probe whose tip is sharp, which is provided with a desired radius of curvature and whose surface is hardly oxidized. Consequently, since the probe can be maintained in a state that an electric characteristic is good, it can measure a sample with high resolution, the life of the probe can be made long and its cost can be reduced.


Inventors:
SUZUKI KAZUO
Application Number:
JP26042192A
Publication Date:
April 19, 1994
Filing Date:
September 30, 1992
Export Citation:
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Assignee:
NIKON CORP
International Classes:
C23C18/42; C25D7/00; G01B7/34; G01N37/00; G01Q60/10; G01Q60/16; G01Q70/08; G01Q70/16; H01J37/28; (IPC1-7): G01B7/34; H01J37/28