To provide a repairing method of an organic EL by laser, in which a position of a defective part of an organic EL element is precisely grasped and laser is irradiated to the specific area and such defective parts only are repaired, without impairing a function of the whole of the organic EL elements in the pixel having a defective part and maintaining a luminous function of other organic EL elements than defective ones.
A current voltage characteristic of an organic EL element is measured and an existence of a leak current is judged by comparing such current voltage characteristics with a predetermined current voltage characteristics. A leak luminous image is obtained by impressing a voltage less than a luminescence threshold on the organic EL element, and laser is irradiated and the leak luminous part is repaired. Repairing is confirmed when there is no leak luminous image by impressing a voltage less than a luminescence threshold on the organic EL element and a leak current is decreased when a current voltage characteristic is measured.
MIURA NOBUHITO
TSUTSUI OSANORI
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