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Title:
SCANNING ELECTRONIC MICROSCOPE OR SIMILAR EQUIPMENT
Document Type and Number:
Japanese Patent JPS5583144
Kind Code:
A
Abstract:

PURPOSE: To facilitate the confirmation of the grade of vacuum by indicating the grade of vacuum in the body to be exhausted on the indicator for indicating the image of specimen.

CONSTITUTION: The inside of mirror 1 is exhausted by vacuum pump 2 and the grade of vacuum is measured by vacuum meter 3. The output from secondary electron detector 4 for detecting the secondary electron emitted from the surface of specimen when scanning on the surface of specimen with focused electron beam in two dimension is provided through signal amplifier 5 to signal switching circuit 6, to indicate the image of specimen on cathode ray tube 7 in accordance with the operation of said signal switching circuit and to indicate the grade of vacuum in mirror body 1. Consequently the confirmation of vacuum in the body is facilitated.


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Inventors:
SATOU SEISHIROU
Application Number:
JP15648378A
Publication Date:
June 23, 1980
Filing Date:
December 20, 1978
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
H01J37/22; G01N23/225; (IPC1-7): G01N23/225; H01J37/22



 
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