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Title:
半導体装置およびその製造方法
Document Type and Number:
Japanese Patent JP4469677
Kind Code:
B2
Abstract:
A first doped layer of a conductivity type opposite to that of source/drain regions is formed in a semiconductor substrate under a gate electrode. A second doped layer of the conductivity type opposite to that of the source/drain regions is formed in the semiconductor substrate below the first doped layer. The first doped layer has a first peak in dopant concentration distribution in the depth direction. The first peak is located at a position shallower than the junction depth of the source/drain regions. The second doped layer has a second peak in dopant concentration distribution in the depth direction. The second peak is located at a position deeper than the first peak and shallower than the junction depth of the source/drain regions. The dopant concentration at the first peak is higher than that at the second peak.

Inventors:
Takato Handa
Kurimoto Kazumi
Application Number:
JP2004227688A
Publication Date:
May 26, 2010
Filing Date:
August 04, 2004
Export Citation:
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Assignee:
Panasonic Corporation
International Classes:
H01L29/78; H01L21/336; H01L21/8234; H01L21/8238; H01L27/088; H01L27/092
Domestic Patent References:
JP6151828A
JP2000299462A
JP11307766A
JP6244196A
JP7283413A
JP5110081A
JP2002198529A
JP4324682A
JP8250715A
JP2001274382A
JP5029612A
JP2002368212A
JP9246538A
Attorney, Agent or Firm:
Hiroshi Maeda
Hiroshi Koyama
Hiroshi Takeuchi
Takahisa Shimada
Yuji Takeuchi
Katsumi Imae
Atsushi Fujita
Kazunari Ninomiya
Tomoo Harada
Iseki Katsumori