To obtain a semiconductor inspection device which can realize inspection in an environment close to the actual use condition of a product, without requiring preparation of an expensive LSI tester, in inspecting a semiconductor device for radio communication.
The semiconductor inspection device for inspecting the semiconductor device for radio communication, which converts an inputted analog high-frequency signal into a low-frequency signal to be outputted, and which converts the inputted low-frequency signal into an analog high-frequency signal to be outputted, includes a reference circuit having a function similar to that of the semiconductor device, wherein the characteristics are confirmed, in advance; and a transmission means for inputting the analog high-frequency signal outputted from the reference circuit into the semiconductor device and for inputting the analog high-frequency signal outputted from the semiconductor device into the reference circuit.
HATOMURA MITSURU
UMEGAMI TOSHIYUKI
KYOEI IND
Hideki Takahashi