To solve the problem that a tester cannot be effectively used for a semiconductor integrated circuit because the tester has no capability to generate a long cycle signal though the semiconductor integrated circuit which uses a redundant circuit using antifuses and a long pulse and long cycle fuse write control signal is necessary for write to the antifuses.
A semiconductor integrated circuit incorporates an internal signal generation circuit which uses a short pulse signal from the tester to generate the long pulse and long cycle fuse write control signal. Write to antifuses can be performed by the long pulse and long cycle fuse write control signal generated by the internal signal generation circuit, without restrictions by the tester capability, whereby the tester can be effectively used.
Shuichi Fukuda
Takashi Sasaki
Next Patent: VIDEO RECEIVER