To provide a semiconductor manufacturing method capable of easily forming a desired circuit by print processing in a wafer state after a wafer test and a semiconductor device.
A semiconductor manufacturing method comprises: a step of forming a groove part having a predetermined depth in a drawn pattern formation region of a wafer; a step of inspecting whether trimming is required for the wafer; a step of injecting a conductive solvent into the groove part of the wafer which requires the trimming and drawing a drawing pattern; a step of performing deaeration and low-temperature annealing after drawing the drawing pattern; a step of planarizing a film-formation surface after deaeration and low-temperature annealing were performed to form a film; and a step of performing high-temperature annealing after planarizing the film-formation surface.
AKIYAMA HAJIME
YASUDA NAOKI
JP2004267874A | 2004-09-30 | |||
JP2005129922A | 2005-05-19 | |||
JP2004273679A | 2004-09-30 | |||
JP2005199269A | 2005-07-28 | |||
JP2004141856A | 2004-05-20 | |||
JP2003059940A | 2003-02-28 |
Mitsuo Tanaka