Title:
シャッターの点検構造、及びシャッターの点検方法
Document Type and Number:
Japanese Patent JP6867787
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an inspection structure of a shutter and an inspection method of the shutter capable of simplifying inspection work.SOLUTION: An inspection structure of a shutter 1 is the inspection structure for aiming at the shutter 1 having a driving side bearing part for rotatably supporting a winding shaft 40 for openably-closably moving a shutter curtain for opening-closing an opening part of a building, an opening-closing machine 60 for rotatably driving the winding shaft 40 and a transmission member 70 for transmitting rotational driving force of the opening-closing machine 60 to the winding shaft 40, and comprises a driving side bearing plate 90 provided in substantially parallel to the transmission member 70, and the driving side bearing plate 90 is formed with an inspection hole 150 capable of inspecting a state of the transmission member 70.SELECTED DRAWING: Figure 2
Inventors:
Takumi Takahashi
Hiroki Akatsuka
Hiroki Akatsuka
Application Number:
JP2016231228A
Publication Date:
May 12, 2021
Filing Date:
November 29, 2016
Export Citation:
Assignee:
Sanwa Shutter Corporation
International Classes:
E06B9/17; E06B9/70
Domestic Patent References:
| JP5639117Y2 | ||||
| JP2012215018A | ||||
| JP325793U | ||||
| JP2012202080A |
Foreign References:
| US20120137585 |
Attorney, Agent or Firm:
Tatsuya Saito