Title:
単結晶Ｘ線構造解析装置とそのための方法
Document Type and Number:
Japanese Patent JP7265234
Kind Code:
B2
Abstract:
A user-friendly single-crystal X-ray structure analysis apparatus for quickly performing a single-crystal X-ray structure analysis using a crystalline sponge and easily making it possible by including managing related information and a method therefor, are provided. There are provided an X-ray source that generates X-rays; a sample holder comprising a porous complex crystal capable of soaking a sample in a plurality of fine pores formed therein; a goniometer that rotationally moves, the sample holder being attached to the goniometer; an X-ray irradiation section that irradiates the X-rays from the X-ray source to the sample held by the sample holder attached to the goniometer; an X-ray detection measurement section that detects and measures X-rays diffracted or scattered by the sample; a structure analysis section that performs a structure analysis of the sample based on the diffracted or scattered X-rays measured by the X-ray detection measurement section; an information acquisition section 600 that acquires invariable information about the porous complex crystal or variable information provided after the sample is soaked therein; and an information storage section 111 that stores the invariable information or the variable information acquired by the information acquisition section 600.
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Inventors:
Takashi Sato
Application Number:
JP2020557646A
Publication Date:
April 26, 2023
Filing Date:
November 21, 2019
Export Citation:
Assignee:
Rigaku Corporation
International Classes:
G01N23/20025; G01N1/28; G01N23/205; G01N23/207
Domestic Patent References:
| JP2003083412A | ||||
| JP2014130063A | ||||
| JP6194276A | ||||
| JP2013156218A |
Foreign References:
| WO2014038220A1 |
Other References:
Yasuhide Inokuma, et al,X-ray analysis on the nanogram to microgram scale using porus complexes,Nature,英国,2013年03月,Vol. 495,461-466
Attorney, Agent or Firm:
Takeo Fukuchi
Yoichi Shirakawa
Yoichi Shirakawa