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Patent Searching and Data


Title:
SLAVE STATION TEST SYSTEM
Document Type and Number:
Japanese Patent JPH0399566
Kind Code:
A
Abstract:

PURPOSE: To eliminate the need for the provision of a test equipment corresponding to a slave station by fetching a test control signal supplied from a master station test equipment to plural slave stations into a slave station test equipment, selecting further a slave station at the slave station test equipment to conduct the test.

CONSTITUTION: A subscriber line test of an analog subscriber slave station 1 and an I interface subscriber slave station 2, and a test of a slave station such as a terminal test and a pseudo outgoing/incoming test are conducted by a slave station test equipment 3. A test control signal of a master station test equipment 8 is received by the equipment 3 via a transmission line 4 and a control signal relating to slave stations 1, 2 is fetched by the equipment 3 with a test station data and a control signal relating to slave stations 1', 2' is fetched by a slave station test equipment 3'. Then a controller 3b in the equipment 3 translates the test kind and test object or the like to control the test equipment 3a to conduct the test of the slave stations 1, 2 via a test line 3c. The result of test is added with a tested device number by the equipment 3b and the result is returned to the equipment 8.


Inventors:
KOJIMA KIMIFUMI
Application Number:
JP23565489A
Publication Date:
April 24, 1991
Filing Date:
September 13, 1989
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
H04M3/26; (IPC1-7): H04M3/26
Attorney, Agent or Firm:
Katsuo Ogawa (1 person outside)