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Patent Searching and Data


Title:
SOLAR CELL INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2012124451
Kind Code:
A
Abstract:

To inspect a solar cell or a solar cell panel with high accuracy without the need for transporting the solar cell to an inspection place.

A solar cell panel SP is mounted on a stage 40, and a current is fed by applying a DC voltage to the solar cell panel SP from a conduction signal supply circuit 65 and a conduction circuit 66. A magnetic field generated by the current flowing to the solar cell panel SP is detected at a plurality of positions facing the solar cell panel SP by moving a magnetic sensor 10. A controller 70 captures the magnetic field thus captured via a sensor signal extraction circuit 67 and a lock-in amplifier 68, and then calculates the distribution of the magnitude of current in the extention direction of a plurality of electrodes of the solar cell panel SP, and the distribution of the magnitude of current between the plurality of electrodes.


Inventors:
HAYASHI TAKAYUKI
Application Number:
JP2011084931A
Publication Date:
June 28, 2012
Filing Date:
April 06, 2011
Export Citation:
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Assignee:
PULSTEC IND CO LTD
International Classes:
H01L31/04
Domestic Patent References:
JP2009257941A2009-11-05
JPH08101915A1996-04-16
JP2002055140A2002-02-20
Attorney, Agent or Firm:
Patent business corporation Prospec patent office