Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
STRUCTURE FOR DETECTING ETCHING COMPLETION, ETCHING COMPLETION DETECTING METHOD, AND ETCHING METHOD
Document Type and Number:
Japanese Patent JP2006150563
Kind Code:
A
Abstract:

To provide an etching completion detecting method capable of correctly and reliably detecting etching completion even when manufacturing a very small structure by performing the etching on a work, a structure for detecting etching completion, and an etching method.

When a structure for detecting etching completion performs the etching of a layer 103' to be etched via a mask 11' under the same or equivalent condition to that of the etching on a work, and a portion of the layer 103' to be etched corresponding to an opening part 113 is removed before reaching an etching stopping member 102'. Since the side etching is generated along the etching stopping member 102', the portion of the layer 103' to be etched corresponding to a portion 114 for detection is detached from the etching stopping member 102', and etching completion is detected thereby.


Inventors:
NAKAJIMA TAKUYA
Application Number:
JP2004348867A
Publication Date:
June 15, 2006
Filing Date:
December 01, 2004
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SEIKO EPSON CORP
International Classes:
B81B1/00; B81C1/00; H01L21/3065
Attorney, Agent or Firm:
Tatsuya Masuda
Kazuo Asahi