Title:
構造物評価システム、構造物評価装置及び構造物評価方法
Document Type and Number:
Japanese Patent JP7155277
Kind Code:
B2
Abstract:
According to one embodiment, a structure evaluation system of the embodiments includes a plurality of sensors, an arrival time determiner, a reliability calculator, and a map generator. The plurality of sensors detect elastic waves. The arrival time determiner determines arrival times of the elastic waves using elastic waves detected by the plurality of respective sensors. The reliability calculator calculates reliabilities related to measurement waveforms of the elastic waves on the basis of the arrival times. The map generator generates a first map on the basis of the calculated reliabilities or the reliabilities and a distance.
Inventors:
Sanae Iida
Takashi Usui
Takashi Usui
Application Number:
JP2020546513A
Publication Date:
October 18, 2022
Filing Date:
March 15, 2019
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01N29/14; G01N29/07; G01N29/44
Domestic Patent References:
| JP2018165732A | ||||
| JP2004219075A |
Foreign References:
| CN108459082A |
Attorney, Agent or Firm:
Patent Attorney Shiga International Patent Office
Previous Patent: Phenylpyrrolidinone formyl peptide 2 receptor agonist
Next Patent: saddle-riding vehicle
Next Patent: saddle-riding vehicle