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Title:
被写体異常有無調査システム
Document Type and Number:
Japanese Patent JP6868487
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a technology for displaying a change portion of a subject from investigation, inspection and deterioration states of the change portion and a viewpoint, for example, a viewpoint of a work position from a worker who performs repair or the like in an intelligible manner, and for diagnosing the state of the change portion, and for investigating the presence/absence of abnormality.SOLUTION: The subject abnormality presence/absence investigation system comprises: an image processing part for outputting an image photographed by a camera as a three-dimensional image to a display device; an image difference detection part for comparing a current image with the past image to detect a difference between both images; and a display part for performing mapping-display of a difference between the three-dimensional image of the subject from the image processing part and the image from the image difference detection part, and for displaying a video from a worker path and a worker viewpoint or a perspective image from an inspection path output from a wearable terminal that a worker who confirms the state of the subject wears. Thus, it is possible to confirm an abnormal point and an abnormal state of a change portion based on a difference between images in accordance with the three-dimensional image, the difference between the images, the video from the worker path and the worker viewpoint or the perspective image from the inspection path at the display part.SELECTED DRAWING: Figure 1

Inventors:
Narita
Yoshiaki Yazawa
Satoshi Yamamoto
Koichiro Yawata
Zhao Yu
Kentaro Onishi
Application Number:
JP2017128818A
Publication Date:
May 12, 2021
Filing Date:
June 30, 2017
Export Citation:
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Assignee:
Hitachi Systems Co., Ltd.
International Classes:
G08B25/00; G06T1/00; G08B21/00
Domestic Patent References:
JP2016018463A
Foreign References:
WO2006114955A1
US20150213590
Attorney, Agent or Firm:
Patent Business Corporation Daiichi International Patent Office